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Process Integration and Device Characterization in Microelectronic Manufacturing - PAL Format (VHS video casette)
Process Integration and Device Characterization in Microelectronic Manufacturing - PAL Format (VHS video casette): Ieee
Process Integration and Device Characterization in Microelectronic Manufacturing - PAL Format (VHS video casette): Ieee

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Process Integration and Device Characterization in Microelectronic Manufacturing - PAL Format (VHS video casette)

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In the video from SPIE, Badih El-Kareh is a Senior Scientist at IBM, Hopewell Junction, New York, working in process integration, 256 Mbit DRAM project. A discussion of submicron manufacturing technologies, integration problems, and device characterization will be provided in this course. Technology trends and issues will be presented, with a focus on CMOS processes and their characterization. Techniques to extract MOSFET parameters and relate them to processes will be described.

General

Studio: Institute of Electrical & Electronics Engineers(IEEE)
Country of origin: United States
Release date: October 1999
Authors: Ieee
Format: VHS video casette
Running time: 5 hours
Categories: Movies & TV
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LSN: 0-7803-4632-7

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