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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components

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Symposium on VLSI Technology 2000 (Hardcover)
Symposium on VLSI Technology 2000 (Hardcover): Institute of Electrical and Electronics Engineers
Symposium on VLSI Technology 2000 (Hardcover): Institute of Electrical and Electronics Engineers

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Symposium on VLSI Technology 2000 (Hardcover)

Institute of Electrical and Electronics Engineers

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These conference prodeedings cover such topics as: copper interconnects; novel devices; high-K dielectrics; process technology; embedded DRAM; gate electrode engineering; DRAM cells; gate oxide scaling and reliability; DRAM capacitors; and high performance RF.

General

Imprint: I.E.E.E.Press
Country of origin: United States
Release date: July 2000
Authors: Institute of Electrical and Electronics Engineers
Dimensions: 279 x 216mm (L x W)
Format: Hardcover
Pages: 242
ISBN-13: 978-0-7803-6306-9
Barcode: 9780780363069
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
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LSN: 0-7803-6306-X

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