Spectroscopy in Catalysis' describes the most important modern
analytical techniques used to investigate catalytic surfaces. These
include electron spectroscopy (XPS, UPS, AES, EELS), ion
spectroscopy (SIMS, SNMS, RBS, LEIS), vibrational spectroscopy
(infrared, Raman, EELS), temperature-programmed techniques (TPR,
TPO, TDS), diffraction (XRD, LEED, EXAFS), and microscopy (TEM,
SEM, STEM, STM, AFM, FEM, and FIM). Each chapter uses current
applications to illustrate the type of information that the
technique provides and evaluates its possibilities and limitations.
This second edition includes significant new developments, for
example scanning probe microscopies, the imaging and vibrational
techniques have been revised, the case studies expanded with an
example on polymerization catalysts, and all the other chapters
updated with recent examples and relevant new literature.
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