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Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes (Hardcover)
Janet Benton/CoR2,549
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Product Details
General
Imprint | SPIE Society of Photo-Optical Instrumentation Engi |
Country of origin | United States |
Release date | June 2006 |
Availability | Supplier out of stock. If you add this item to your wish list we will let you know when it becomes available. |
Authors | Janet Benton/Co |
Editors | Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer, Francois Tardif, Janet Benton |
Dimensions | 235 x 159mm (L x W) |
Format | Hardcover |
Pages | 552 |
ISBN-13 | 978-0-8194-3497-5 |
Barcode | 9780819434975 |
Categories | |
LSN | 0-8194-3497-3 |
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