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Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes (Hardcover) Loot Price: R1,842
Discovery Miles 18 420
Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes (Hardcover): Janet Benton/Co
Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes (Hardcover): Janet Benton/Co

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Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes (Hardcover)

Janet Benton/Co; Edited by Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer, Francois Tardif, Janet Benton

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Loot Price R1,842 Discovery Miles 18 420 | Repayment Terms: R171 pm x 12*

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General

Imprint: SPIE Society of Photo-Optical Instrumentation Engi
Country of origin: United States
Release date: June 2006
Authors: Janet Benton/Co
Editors: Bernd O. Kolbesen • Cor Claeys • Peter Stallhofer • Francois Tardif • Janet Benton
Dimensions: 235 x 159mm (L x W)
Format: Hardcover
Pages: 552
ISBN-13: 978-0-8194-3497-5
Barcode: 9780819434975
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General
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Books > Professional & Technical > Technology: general issues
Books > Professional & Technical > Technology: general issues > General
LSN: 0-8194-3497-3

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