0
Your cart

Your cart is empty

Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics

Buy Now

Optical Manufacturing and Testing, Volume 11 - 9-11 August 2015, San Diego, California, United States (Paperback) Loot Price: R3,349 Discovery Miles 33 490

This item is a special order that could take a long time to obtain.

Optical Manufacturing and Testing, Volume 11 - 9-11 August 2015, San Diego, California, United States (Paperback): Oliver...
Optical Manufacturing and Testing, Volume 11 - 9-11 August 2015, San Diego, California, United States (Paperback): Oliver...

Share your images

Optical Manufacturing and Testing, Volume 11 - 9-11 August 2015, San Diego, California, United States (Paperback)

Oliver Fahnle, Raymond Williamson, Dae Wook Kim, Olaf Dambon

Series: Proceedings of SPIE, 9575

 (sign in to rate)
Loot Price R3,349 Discovery Miles 33 490

Bookmark and Share

Our supplier does not have stock of this product at present, but we can create a special order for you. Alternatively, if you add it to your wishlist we will send you an email message should it become available from stock. Special orders from this supplier are normally fulfilled within 31 - 41 working days. Please note:

  • Special order items cannot be combined on an order with other items.
  • Special orders can sometimes take significantly longer than this estimate and sometimes our suppliers may be unable to fill a special order.
  • We cannot accept returns of special order titles.
  • If we haven't been able to get the product for you within about 3 months, we will automatically cancel the order and fully refund any payments that you have made.

New to special orders? Find out more.

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

General

Imprint: Spie Press
Country of origin: United States
Series: Proceedings of SPIE, 9575
Release date: October 2015
Editors: Oliver Fahnle • Raymond Williamson • Dae Wook Kim • Olaf Dambon
Dimensions: 279 x 216mm (L x W)
Format: Paperback
Pages: 277
ISBN-13: 978-1-62841-741-8
Barcode: 9781628417418
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General
Promotions
LSN: 1-62841-741-2

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!

Loyalty partners