"Advances in Imaging and Electron Physics "merges two long-running serials--"Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy."
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
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"Advances in Imaging and Electron Physics "merges two long-running serials--"Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy."
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
Imprint | Academic Press Inc |
Country of origin | United States |
Series | Advances in Imaging and Electron Physics |
Release date | July 2011 |
Availability | Expected to ship within 12 - 17 working days |
First published | July 2011 |
Series editors | Peter W. Hawkes |
Dimensions | 229 x 152 x 40mm (L x W x T) |
Format | Hardcover - Cloth over boards |
Pages | 752 |
Edition | New |
ISBN-13 | 978-0-12-381310-7 |
Barcode | 9780123813107 |
Categories | |
LSN | 0-12-381310-7 |