Providing an important link between the theoretical knowledge in
the field of non-linier physics and practical application problems
in microelectronics, the purpose of the book is popularization of
the physical approach for reliability assurance. Another unique
aspect of the book is the coverage given to the role of local
structural defects, their mathematical description, and their
impact on the reliability of the semiconductor devices.
Is the information for this product incomplete, wrong or inappropriate?
Let us know about it.
Does this product have an incorrect or missing image?
Send us a new image.
Is this product missing categories?
Add more categories.
Review This Product
No reviews yet - be the first to create one!