A new window to local studies of interface phenomena at solid state
surfaces has been opened by the development of local probe
techniques such as Scanning Tunneling Microscopy (STM) or Atomic
Force Microscopy (AFM) and related methods during the past fifteen
years. The in-situ application of local probe methods in different
systems belongs to modern nanotechnology and has two aspects: an
analytical aspect and a preparative aspect.
The first aspect covers the application of the local probe methods
to characterize thermodynamic, structural and dynamic properties of
solid state surfaces and interfaces and to investigate local
surface reactions. Two methods which are still in the beginning of
their development represent the second aspect: tip and cantilever.
They can be used to form defined nano-objects such as molecular or
atomic clusters, quantum dots etc. as well as to structure or
modify solid state surfaces in the nanometer range.
This IUPAC monograph is a comprehensive treatment of both aspects
and presents the current state of knowledge. It is written for
scientists active in the area of nanotechnology.
Wiley-VCH Verlag GmbH
|Country of origin:
Wolfgang J Lorenz
• Waldfried Plieth
||Electronic book text
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