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Gettering and Defect Engineering in Semiconductor Technology XI (Paperback)
Volume is indexed by Thomson Reuters CPCI-S (WoS). This proceedings volume contains 126 contributions from the 11th international meeting on Gettering and Defect Engineering in Semiconductor Technology GADEST 2005 held at "La Badine" at the Giens peninsula south of France.
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Product Description
Volume is indexed by Thomson Reuters CPCI-S (WoS). This proceedings volume contains 126 contributions from the 11th international meeting on Gettering and Defect Engineering in Semiconductor Technology GADEST 2005 held at "La Badine" at the Giens peninsula south of France.
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Product Details
General
Imprint | Trans Tech Publications Ltd |
Country of origin | Switzerland |
Series | Solid State Phenomena, Volumes 108-109 |
Release date | October 2005 |
Availability | Supplier out of stock. If you add this item to your wish list we will let you know when it becomes available. |
First published | 2005 |
Editors | Bernard Pichaud, A. Claverie, Daniel Alquier, Hans Richter, Martin Kittler |
Dimensions | 240 x 170 x 42mm (L x W x T) |
Format | Paperback |
Pages | 830 |
ISBN-13 | 978-3-908451-13-6 |
Barcode | 9783908451136 |
Categories | |
LSN | 3-908451-13-2 |
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