Oxide Reliability - A Summary of Silicon Oxide Wearout, Breakdown, and Reliability (Electronic book text)


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Product Details

General

Imprint

World Scientific Publishing Co Pte Ltd

Country of origin

Singapore

Release date

November 2002

Availability

We don't currently have any sources for this product. If you add this item to your wish list we will let you know when it becomes available.

Authors

Format

Electronic book text

Pages

281

ISBN-13

978-981-277-806-2

Barcode

9789812778062

Categories

LSN

981-277-806-3



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