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Defects in SiO2 and Related Dielectrics: Science and Technology (Paperback, Softcover reprint of the original 1st ed. 2000) Loot Price: R3,786
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Defects in SiO2 and Related Dielectrics: Science and Technology (Paperback, Softcover reprint of the original 1st ed. 2000):...

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Defects in SiO2 and Related Dielectrics: Science and Technology (Paperback, Softcover reprint of the original 1st ed. 2000)

Gianfranco Pacchioni, Linards Skuja, David L. Griscom

Series: NATO Science Series II, 2

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List price R4,004 Loot Price R3,786 Discovery Miles 37 860 | Repayment Terms: R352 pm x 12* You Save R218 (5%)

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Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

General

Imprint: Springer
Country of origin: Netherlands
Series: NATO Science Series II, 2
Release date: December 2000
First published: 2000
Editors: Gianfranco Pacchioni • Linards Skuja • David L. Griscom
Dimensions: 240 x 160 x 20mm (L x W x T)
Format: Paperback
Pages: 624
Edition: Softcover reprint of the original 1st ed. 2000
ISBN-13: 978-0-7923-6686-7
Categories: Books > Science & Mathematics > Physics
Books > Professional & Technical > Mechanical engineering & materials
Books > Science & Mathematics > Physics > Electricity, magnetism & electromagnetism
Books > Professional & Technical > Mechanical engineering & materials > Materials science
Books > Professional & Technical > Mechanical engineering & materials > Materials science > General
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LSN: 0-7923-6686-7
Barcode: 9780792366867

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