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2003 Quality Electronic Design(Isqed)4th Symp (Paperback, Illustrated edition)
IeeePapers from a March 2003 symposium describe the latest research in deep submicron integrated circuit design and development. Some areas discussed include reliability and design in deep submicron technologies, reducing leakage currents in VLSI circuits, SoC methodology, testing of SoCs, and design co
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Papers from a March 2003 symposium describe the latest research in deep submicron integrated circuit design and development. Some areas discussed include reliability and design in deep submicron technologies, reducing leakage currents in VLSI circuits, SoC methodology, testing of SoCs, and design co
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Product Details
General
Imprint | IEEE Computer Society Press,U.S. |
Country of origin | United States |
Release date | 2003 |
Availability | We don't currently have any sources for this product. If you add this item to your wish list we will let you know when it becomes available. |
Authors | Ieee |
Dimensions | 267 x 210mm (L x W) |
Format | Paperback |
Pages | 480 |
Edition | Illustrated edition |
ISBN-13 | 978-0-7695-1881-7 |
Barcode | 9780769518817 |
Categories | |
LSN | 0-7695-1881-8 |
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