Very Large Scale Integration 1998,16th: VTS '98 (Paperback)

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This work contains the proceedings from the 16th IEEE VLSI Test Symposium. Subjects covered include: core and processor test; RAM test; BIST; current testing techniques; delay test and diagnosis; fault modeling and parametric test; and analog test sequential circuits test concurrent checking.

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Product Description

This work contains the proceedings from the 16th IEEE VLSI Test Symposium. Subjects covered include: core and processor test; RAM test; BIST; current testing techniques; delay test and diagnosis; fault modeling and parametric test; and analog test sequential circuits test concurrent checking.

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Product Details

General

Imprint

IEEE Computer Society Press,U.S.

Country of origin

United States

Release date

April 1998

Availability

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Authors

,

Dimensions

279 x 216mm (L x W)

Format

Paperback

Pages

500

ISBN-13

978-0-8186-8436-4

Barcode

9780818684364

Categories

LSN

0-8186-8436-4



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