Advances in Imaging and Electron Physics, Volume 174 - Silicon-Based Millimetre-wave Technology (Hardcover, New)


"Advances in Imaging and Electron Physics "merges two long-running serials--"Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy."
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Key features:

* Contributions from leading authorities * Informs and updates on all the latest developments in the field


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Product Description

"Advances in Imaging and Electron Physics "merges two long-running serials--"Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy."
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Key features:

* Contributions from leading authorities * Informs and updates on all the latest developments in the field

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Product Details

General

Imprint

Academic Press Inc

Country of origin

United States

Series

Advances in Imaging and Electron Physics

Release date

December 2012

Availability

Expected to ship within 12 - 17 working days

First published

December 2012

Volume editors

Dimensions

229 x 152mm (L x W)

Format

Hardcover

Pages

484

Edition

New

ISBN-13

978-0-12-394298-2

Barcode

9780123942982

Categories

LSN

0-12-394298-5



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