0
Your cart

Your cart is empty

Books > Professional & Technical > Mechanical engineering & materials

Buy Now

An Introduction to Surface Analysis by XPS and AES (Hardcover, 2nd Edition) Loot Price: R1,542
Discovery Miles 15 420
You Save: R156 (9%)
An Introduction to Surface Analysis by XPS and AES (Hardcover, 2nd Edition): John F. Watts, John Wolstenholme

An Introduction to Surface Analysis by XPS and AES (Hardcover, 2nd Edition)

John F. Watts, John Wolstenholme

 (sign in to rate)
List price R1,698 Loot Price R1,542 Discovery Miles 15 420 | Repayment Terms: R141 pm x 12* You Save R156 (9%)

Bookmark and Share

Expected to ship within 10 - 15 working days

Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples--including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.

General

Imprint: Wiley-Blackwell
Country of origin: United States
Release date: November 2019
Authors: John F. Watts • John Wolstenholme
Dimensions: 228 x 158 x 18mm (L x W x T)
Format: Hardcover
Pages: 288
Edition: 2nd Edition
ISBN-13: 978-1-119-41758-3
Categories: Books > Science & Mathematics > Chemistry
Books > Professional & Technical > Mechanical engineering & materials
Books > Science & Mathematics > Chemistry > General
Books > Professional & Technical > Mechanical engineering & materials > General
LSN: 1-119-41758-9
Barcode: 9781119417583

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!

Partners