Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices (Hardcover, 2004 ed.)


A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects.

The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.


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Product Description

A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects.

The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.

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Product Details

General

Imprint

Springer-Verlag New York

Country of origin

United States

Series

NATO Science Series II: Mathematics, Physics and Chemistry, 151

Release date

July 2004

Availability

Expected to ship within 10 - 15 working days

First published

2004

Editors

,

Dimensions

279 x 210 x 22mm (L x W x T)

Format

Hardcover

Pages

368

Edition

2004 ed.

ISBN-13

978-1-4020-2168-8

Barcode

9781402021688

Categories

LSN

1-4020-2168-2



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