Mechanical Stress on the Nanoscale - Simulation, Material Systems and Characterization Techniques (Electronic book text)


Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques.
Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.

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Product Description

Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques.
Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.

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Product Details

General

Imprint

Wiley-VCH Verlag GmbH

Country of origin

United States

Release date

December 2011

Availability

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Editors

, ,

Format

Electronic book text

Pages

644

ISBN-13

978-6613379498

Barcode

9786613379498

Categories

LSN

6613379492



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