Defect and Microstructure Analysis by Diffraction (Hardcover)


This book reviews the state of the art for determining the "real" structure of matter. Nature does not stack atoms up in crystals in a perfect manner. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. These mistakes or defects determine the physical properties of a material and understanding them is critical to predicting a new materials properties. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction.

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Product Description

This book reviews the state of the art for determining the "real" structure of matter. Nature does not stack atoms up in crystals in a perfect manner. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. These mistakes or defects determine the physical properties of a material and understanding them is critical to predicting a new materials properties. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction.

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Product Details

General

Imprint

Oxford UniversityPress

Country of origin

United Kingdom

Series

International Union of Crystallography Monographs on Crystallography, 10

Release date

2001

Availability

Expected to ship within 10 - 15 working days

First published

March 2000

Editors

, ,

Dimensions

241 x 162 x 48mm (L x W x T)

Format

Hardcover

Pages

808

ISBN-13

978-0-19-850189-3

Barcode

9780198501893

Categories

LSN

0-19-850189-7



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