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Semiconductor Memories - Testing and Reliability (Paperback)
Semiconductor Memories - Testing and Reliability (Paperback): Rochit Rajsuman, Pinaki Mazumder, Rochit Rajusuman

Semiconductor Memories - Testing and Reliability (Paperback)

Rochit Rajsuman, Pinaki Mazumder, Rochit Rajusuman

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This text addresses testing problems and solutions arising from the size and complexity of modern semiconductor memory chips. It includes discussion of: memory fault models; test objectives; testing algorithms; hardware approaches for minimizing test time; and reliability testing and prediction.

General

Imprint: IEEE Computer Society Press,U.S.
Country of origin: United States
Release date: May 1997
Editors: Rochit Rajsuman • Pinaki Mazumder • Rochit Rajusuman
Dimensions: 279 x 216mm (L x W)
Format: Paperback
Pages: 400
ISBN-13: 978-0-8186-7797-7
Categories: Books > Professional & Technical > Electronics & communications engineering
Books > Computing & IT > Computer hardware & operating systems
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering
Books > Computing & IT > Computer hardware & operating systems > Systems management
Books > Computing & IT > Computer hardware & operating systems > Storage media & peripherals
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
LSN: 0-8186-7797-X
Barcode: 9780818677977

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