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Sell On LootAn Introduction to Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-Sims) and Its Application to Materials Science (Electronic book text)
Sarah Fearn
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Product Details
General
Imprint | Iop Concise Physics |
Country of origin | United States |
Series | Iop Concise Physics |
Release date | October 2015 |
Availability | We don't currently have any sources for this product. If you add this item to your wish list we will let you know when it becomes available. |
Authors | Sarah Fearn |
Format | Electronic book text - Windows |
Pages | 66 |
ISBN-13 | 978-1-68174-088-1 |
Barcode | 9781681740881 |
Categories | Books - All Books  Science & MathematicsScience: general issuesScientific equipment & techniques, laboratory equipmentGeneral |
LSN | 1-68174-088-5 |
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