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An Introduction to Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-Sims) and Its Application to Materials Science (Electronic book text)
An Introduction to Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-Sims) and Its Application to Materials Science...

An Introduction to Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-Sims) and Its Application to Materials Science (Electronic book text)

Sarah Fearn

Series: Iop Concise Physics

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General

Imprint: Iop Concise Physics
Country of origin: United States
Series: Iop Concise Physics
Release date: October 2015
Authors: Sarah Fearn
Format: Electronic book text - Windows
Pages: 66
ISBN-13: 978-1-68174-088-1
Categories: Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > General
Books > Professional & Technical > Technology: general issues > Instruments & instrumentation engineering > Engineering measurement & calibration
Books > Professional & Technical > Mechanical engineering & materials > Materials science > General
LSN: 1-68174-088-5
Barcode: 9781681740881

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