Electrostatic discharge (ESD) continues to impact semiconductor
manufacturing, semiconductor components and systems, as
technologies scale from micro- to nano electronics. This book"
"introduces the fundamentals of ESD, electrical overstress (EOS),
electromagnetic interference (EMI), electromagnetic compatibility
(EMC), and latchup, as well as provides a coherent overview of the
semiconductor manufacturing environment and the final system
assembly. It provides an illuminating look into the integration of
ESD protection networks followed by examples in specific
technologies, circuits, and chips.
The text is unique in covering semiconductor chip manufacturing
issues, ESD semiconductor chip design, and system problems
confronted today as well as the future of ESD phenomena and
Look inside for extensive coverage on: The fundamentals of
electrostatics, triboelectric charging, and how they relate to
present day manufacturing environments of micro-electronics to
nano-technology Semiconductor manufacturing handling and auditing
processing to avoid ESD failures ESD, EOS, EMI, EMC, and latchup
semiconductor component and system level testing to demonstrate
product resilience from human body model (HBM), transmission line
pulse (TLP), charged device model (CDM), human metal model (HMM),
cable discharge events (CDE), to system level IEC 61000-4-2
testsESD on-chip design and process manufacturing practices and
solutions to improve ESD semiconductor chip solutions, also
practical off-chip ESD protection and system level solutions to
provide more robust systemsSystem level concerns in servers,
laptops, disk drives, cell phones, digital cameras, hand held
devices, automobiles, and space applicationsExamples of ESD design
for state-of-the-art technologies, including CMOS, BiCMOS, SOI,
bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, smart
power, magnetic recording technology, micro-machines (MEMs) to
"ESD Basics: From Semiconductor Manufacturing to Product Use"
complements the author's series of books on ESD protection. For
those new to the field, it is an essential reference and a useful
insight into the issues that confront modern technology as we enter
the Nano-electronic Era.
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