This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
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This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
Imprint | Springer-Verlag |
Country of origin | Germany |
Series | Springer Series in Materials Science, 57 |
Release date | December 2010 |
Availability | Expected to ship within 10 - 15 working days |
First published | 2002 |
Authors | C. Claeys, Eddy Simoen |
Dimensions | 235 x 155 x 22mm (L x W x T) |
Format | Paperback |
Pages | 404 |
Edition | Softcover reprint of hardcover 1st ed. 2002 |
ISBN-13 | 978-3-642-07778-4 |
Barcode | 9783642077784 |
Categories | |
LSN | 3-642-07778-1 |