This SPIE course describes the basic interferometry techniques used
in the evaluation of optical components and optical systems. It
discusses interferogram interpretation, computer analysis, and
phase-shifting interferometry, as well as various commonly used
wavefront-measuring interferometers. The instructor describes
specialized techniques such as testing windows and prisms in
transmission, testing 90-degree prisms and corner cubes, measuring
index inhomogeneity, measuring radius of curvature, testing
cylindrical and aspheric surfaces, determining the absolute shape
of flats and spheres, and the use of infrared interferometers for
testing ground surfaces. The course also covers state-of-the-art
direct phase measurement interferometers.
Institute of Electrical & Electronics Engineers(IEEE)
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