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Introduction to Focused Ion Beams - Instrumentation, Theory, Techniques and Practice (Hardcover, 2005 ed.)
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
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Product Description
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
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Product Details
General
Imprint | Springer-Verlag New York |
Country of origin | United States |
Release date | November 2004 |
Availability | Expected to ship within 10 - 15 working days |
First published | 2005 |
Editors | Lucille A Giannuzzi, North Carolina State University |
Dimensions | 235 x 155 x 27mm (L x W x T) |
Format | Hardcover |
Pages | 357 |
Edition | 2005 ed. |
ISBN-13 | 978-0-387-23116-7 |
Barcode | 9780387231167 |
Categories | |
LSN | 0-387-23116-1 |
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