My Orders
Wishlist
Help
Sell On Loot
Introduction to Focused Ion Beams - Instrumentation, Theory, Techniques and Practice (Paperback, Softcover reprint of hardcover 1st ed. 2005)
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
R3,873
Or split into 4x interest-free payments of 25% on orders over R50
Learn more
38730
@R363pm x 12* 
Ships in 10 - 15 working days
Add to wish listReview this Item
Product Description
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Customer Reviews
No reviews or ratings yet - be the first to create one!
Product Details
General
Imprint | Springer-Verlag New York |
Country of origin | United States |
Release date | October 2010 |
Availability | Expected to ship within 10 - 15 working days |
First published | 2005 |
Editors | Lucille A Giannuzzi, North Carolina State University |
Dimensions | 235 x 155 x 29mm (L x W x T) |
Format | Paperback |
Pages | 357 |
Edition | Softcover reprint of hardcover 1st ed. 2005 |
ISBN-13 | 978-1-4419-3574-8 |
Barcode | 9781441935748 |
Categories | |
LSN | 1-4419-3574-6 |
Similar Products | Recommended ProductsSee more 
Trending On Loot
Be the first to know about our
latest deals & promos! Subscribe Now
