Advances in X-ray Analysis, v. 36 - Proceedings of the Forty-first Annual Conference Held in Colorado Springs, Colorado, August 3-7, 1992 (Hardcover, New)


Mathematical Techniques in XRay Spectrometry: Research in the Quantitative Analysis of Individual Particles by XRay Fluorescence Spectrometry (M. Lankosz et al.). Analysis of Light Elements by XRay Spectrometry: XRFA of Carbon in Steels (F. Weber et al.). XRS Techniques and Instrumentation: Diffraction Peaks in XRay Spectroscopy (R.G.Tissot, R.P. Goehner). OnLine, Industrial, and Other Applications of XRS: Application of XRF in the Aluminum Industry (F.R. Feret). XRay Characterization of Thin Films: Grazing Incidence XRay Characterization of Materials (D.K. Bowen, M. Wormington). WholePattern Fitting, Phase Analysis by Diffraction Methods: Phase Identification Using WholePattern Matching (D.K. Smith et al.). Polymer Applications of XRD. HighTemperature and NonAmbient Applications of XRD. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis. XRD Techniques and Instrumentation. 71 additional articles. Index.

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Mathematical Techniques in XRay Spectrometry: Research in the Quantitative Analysis of Individual Particles by XRay Fluorescence Spectrometry (M. Lankosz et al.). Analysis of Light Elements by XRay Spectrometry: XRFA of Carbon in Steels (F. Weber et al.). XRS Techniques and Instrumentation: Diffraction Peaks in XRay Spectroscopy (R.G.Tissot, R.P. Goehner). OnLine, Industrial, and Other Applications of XRS: Application of XRF in the Aluminum Industry (F.R. Feret). XRay Characterization of Thin Films: Grazing Incidence XRay Characterization of Materials (D.K. Bowen, M. Wormington). WholePattern Fitting, Phase Analysis by Diffraction Methods: Phase Identification Using WholePattern Matching (D.K. Smith et al.). Polymer Applications of XRD. HighTemperature and NonAmbient Applications of XRD. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis. XRD Techniques and Instrumentation. 71 additional articles. Index.

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Product Details

General

Imprint

Kluwer Academic / Plenum Publishers

Country of origin

Netherlands

Release date

2001

Availability

Expected to ship within 10 - 15 working days

First published

August 1993

Volume editors

,

Dimensions

230mm (L)

Format

Hardcover

Pages

678

Edition

New

ISBN-13

978-0-306-44571-2

Barcode

9780306445712

Categories

LSN

0-306-44571-9



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