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Angewandte Oberflachenanalyse Mit Sims Sekundar-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Rontgen-Photoelektronen-Spektrometrie (German, Hardcover)
M. Grasserbauer, H. J. Dudek, Maria F. EbelR1,202
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Product Details
General
Imprint | Springer |
Country of origin | United States |
Release date | June 1986 |
Availability | Supplier out of stock. If you add this item to your wish list we will let you know when it becomes available. |
First published | June 1986 |
Authors | M. Grasserbauer, H. J. Dudek, Maria F. Ebel |
Format | Hardcover - Sewn / Cloth over boards |
Pages | 302 |
ISBN-13 | 978-3-540-15050-3 |
Barcode | 9783540150503 |
Languages | value |
Categories | |
LSN | 3-540-15050-1 |
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