Nanoscale Spectroscopy and Its Applications to Semiconductor Research (Paperback, Softcover reprint of the original 1st ed. 2002)


Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research.
This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.

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Product Description

Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research.
This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.

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Product Details

General

Imprint

Springer-Verlag

Country of origin

Germany

Series

Lecture Notes in Physics, 588

Release date

October 2013

Availability

Expected to ship within 10 - 15 working days

First published

2002

Editors

, , ,

Dimensions

235 x 155 x 17mm (L x W x T)

Format

Paperback

Pages

308

Edition

Softcover reprint of the original 1st ed. 2002

ISBN-13

978-3-662-14372-8

Barcode

9783662143728

Categories

LSN

3-662-14372-0



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