New Horizons of Applied Scanning Electron Microscopy (Hardcover, 2010 ed.)

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In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before. Written for: Scientists, practitioners, academic libraries, graduate students

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Product Description

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before. Written for: Scientists, practitioners, academic libraries, graduate students

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Product Details

General

Imprint

Springer-Verlag

Country of origin

Germany

Series

Springer Series in Surface Sciences, 45

Release date

December 2009

Availability

Expected to ship within 10 - 15 working days

First published

2010

Authors

,

Dimensions

235 x 155 x 15mm (L x W x T)

Format

Hardcover

Pages

182

Edition

2010 ed.

ISBN-13

978-3-642-03159-5

Barcode

9783642031595

Categories

LSN

3-642-03159-5



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