Statistical Analysis of Spatial and Spatio-Temporal Point Patterns (Hardcover, 3rd edition)


Written by a prominent statistician and author, the first edition of this bestseller broke new ground in the then emerging subject of spatial statistics with its coverage of spatial point patterns. Retaining all the material from the second edition and adding substantial new material, Statistical Analysis of Spatial and Spatio-Temporal Point Patterns, Third Edition presents models and statistical methods for analyzing spatially referenced point process data. Reflected in the title, this third edition now covers spatio-temporal point patterns. It explores the methodological developments from the last decade along with diverse applications that use spatio-temporally indexed data. Practical examples illustrate how the methods are applied to analyze spatial data in the life sciences. This edition also incorporates the use of R through several packages dedicated to the analysis of spatial point process data. Sample R code and data sets are available on the author's website.

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Product Description

Written by a prominent statistician and author, the first edition of this bestseller broke new ground in the then emerging subject of spatial statistics with its coverage of spatial point patterns. Retaining all the material from the second edition and adding substantial new material, Statistical Analysis of Spatial and Spatio-Temporal Point Patterns, Third Edition presents models and statistical methods for analyzing spatially referenced point process data. Reflected in the title, this third edition now covers spatio-temporal point patterns. It explores the methodological developments from the last decade along with diverse applications that use spatio-temporally indexed data. Practical examples illustrate how the methods are applied to analyze spatial data in the life sciences. This edition also incorporates the use of R through several packages dedicated to the analysis of spatial point process data. Sample R code and data sets are available on the author's website.

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Product Details

General

Imprint

Crc Press

Country of origin

United States

Series

Chapman & Hall/CRC Monographs on Statistics and Applied Probability

Release date

July 2013

Availability

Expected to ship within 12 - 17 working days

First published

2014

Authors

Dimensions

234 x 156 x 23mm (L x W x T)

Format

Hardcover

Pages

268

Edition

3rd edition

ISBN-13

978-1-4665-6023-9

Barcode

9781466560239

Categories

LSN

1-4665-6023-1



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