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Scanning Electron Microscopy and X-ray Microanalysis (Hardcover)
Robert E. LeeA clear description of the field of scanning electron microscopy and X-ray microanalysis, including coverage of specimen preparation, electron emission, lenses and electromagnetic fields, specimen-beam interactions, detectors, image construction, image processing, vacuum generation and energy and wavelength dispersive X-ray spectroscopy.
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Product Description
A clear description of the field of scanning electron microscopy and X-ray microanalysis, including coverage of specimen preparation, electron emission, lenses and electromagnetic fields, specimen-beam interactions, detectors, image construction, image processing, vacuum generation and energy and wavelength dispersive X-ray spectroscopy.
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Product Details
General
Imprint | Prentice Hall Ptr |
Country of origin | United States |
Release date | September 1992 |
Availability | We don't currently have any sources for this product. If you add this item to your wish list we will let you know when it becomes available. |
Authors | Robert E. Lee |
Dimensions | 242 x 182mm (L x W) |
Format | Hardcover |
Pages | 464 |
ISBN-13 | 978-0-13-813759-5 |
Barcode | 9780138137595 |
Categories | |
LSN | 0-13-813759-5 |
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