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Advances in Scanning Probe Microscopy (Hardcover, 2000 ed.)
This book covers several of the most important topics of current interest at the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.
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Product Description
This book covers several of the most important topics of current interest at the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.
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Product Details
General
Imprint | Springer-Verlag |
Country of origin | Germany |
Series | Advances in Materials Research, 2 |
Release date | March 2000 |
Availability | Expected to ship within 10 - 15 working days |
First published | 2000 |
Editors | T. Sakurai, Y. Watanabe |
Dimensions | 235 x 155 x 20mm (L x W x T) |
Format | Hardcover |
Pages | 343 |
Edition | 2000 ed. |
ISBN-13 | 978-3-540-66718-6 |
Barcode | 9783540667186 |
Categories | |
LSN | 3-540-66718-0 |
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