This book covers everything students and professionals need to know about CMOS reliability wearout mechanisms, from basic concepts to the tools necessary to conduct reliability tests and analyze the results. It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent topics, the book covers:
Introduction to Reliability
Gate Dielectric Reliability
Negative Bias Temperature Instability
Hot Carrier Injection
Electromigration Reliability
Stress Voiding
Chapters conclude with practical appendices that provide very basic experimental procedures for readers who are conducting reliability experiments for the first time. "Reliability Wearout Mechanisms in Advanced CMOS Technologies" is ideal for students and new engineers who are looking to gain a working understanding of CMOS technology reliability. It is also suitable as a professional reference for experienced circuit design engineers, device design engineers, and process engineers.
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This book covers everything students and professionals need to know about CMOS reliability wearout mechanisms, from basic concepts to the tools necessary to conduct reliability tests and analyze the results. It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent topics, the book covers:
Introduction to Reliability
Gate Dielectric Reliability
Negative Bias Temperature Instability
Hot Carrier Injection
Electromigration Reliability
Stress Voiding
Chapters conclude with practical appendices that provide very basic experimental procedures for readers who are conducting reliability experiments for the first time. "Reliability Wearout Mechanisms in Advanced CMOS Technologies" is ideal for students and new engineers who are looking to gain a working understanding of CMOS technology reliability. It is also suitable as a professional reference for experienced circuit design engineers, device design engineers, and process engineers.
Imprint | John Wiley & Sons |
Country of origin | United States |
Release date | October 2009 |
Availability | Supplier out of stock. If you add this item to your wish list we will let you know when it becomes available. |
First published | June 2009 |
Authors | AW Strong |
Format | Other digital |
Pages | 864 |
ISBN-13 | 978-0-470-45526-5 |
Barcode | 9780470455265 |
Categories | |
LSN | 0-470-45526-8 |