Defects in SiO2 and Related Dielectrics: Science and Technology (Hardcover, 2000 ed.)


Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

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Product Description

Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

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Product Details

General

Imprint

Springer

Country of origin

Netherlands

Series

NATO Science Series II: Mathematics, Physics and Chemistry, 2

Release date

2001

Availability

Expected to ship within 10 - 15 working days

First published

2000

Editors

, ,

Dimensions

235 x 155 x 34mm (L x W x T)

Format

Hardcover

Pages

624

Edition

2000 ed.

ISBN-13

978-0-7923-6685-0

Barcode

9780792366850

Categories

LSN

0-7923-6685-9



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