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Semiconductor Material and Device Characterization (Hardcover)
Dieter K. SchroderThis detailed sourcebook provides an up-to-date description and unified treatment of the characterization techniques used in the semiconductor industry. It covers electrical, optical, electron- beam, ion-beam, X-ray and gamma ray methods.
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Product Description
This detailed sourcebook provides an up-to-date description and unified treatment of the characterization techniques used in the semiconductor industry. It covers electrical, optical, electron- beam, ion-beam, X-ray and gamma ray methods.
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Product Details
General
Imprint | John Wiley & Sons |
Country of origin | United States |
Release date | July 1990 |
Availability | We don't currently have any sources for this product. If you add this item to your wish list we will let you know when it becomes available. |
Authors | Dieter K. Schroder |
Dimensions | 63mm (L) |
Format | Hardcover |
Pages | 618 |
ISBN-13 | 978-0-471-51104-5 |
Barcode | 9780471511045 |
Categories | |
LSN | 0-471-51104-8 |
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