Image-Based Fractal Description of Microstructures (Paperback, Softcover reprint of hardcover 1st ed. 2003)

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Fractal analysis has rapidly become an important field in materials science and engineering with broad applications to theoretical analysis and quantitative description of microstructures of materials. Fractal methods have thus far shown great potential in engineering applications in quantitative microscopic analysis of materials using commercial microscopes.
This book attempts to introduce the fundamentals and the basis methods of fractal description of microstructures in combination with digital imaging and computer technologies. Basic concepts are given in the form of mathematical expressions. Detailed algorithms in practical applications are also provided. Fractal measurement, error analysis and fractal description of cluster growth, thin films and surfaces are emphasized in this book.
Image-Based Fractal Description of Microstructures provides a comprehensive approach to materials characterization by fractal from theory to application.

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Product Description

Fractal analysis has rapidly become an important field in materials science and engineering with broad applications to theoretical analysis and quantitative description of microstructures of materials. Fractal methods have thus far shown great potential in engineering applications in quantitative microscopic analysis of materials using commercial microscopes.
This book attempts to introduce the fundamentals and the basis methods of fractal description of microstructures in combination with digital imaging and computer technologies. Basic concepts are given in the form of mathematical expressions. Detailed algorithms in practical applications are also provided. Fractal measurement, error analysis and fractal description of cluster growth, thin films and surfaces are emphasized in this book.
Image-Based Fractal Description of Microstructures provides a comprehensive approach to materials characterization by fractal from theory to application.

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Product Details

General

Imprint

Springer-Verlag New York

Country of origin

United States

Release date

December 2010

Availability

Expected to ship within 10 - 15 working days

First published

2003

Authors

, , ,

Dimensions

235 x 155 x 15mm (L x W x T)

Format

Paperback

Pages

272

Edition

Softcover reprint of hardcover 1st ed. 2003

ISBN-13

978-1-4419-5370-4

Barcode

9781441953704

Categories

LSN

1-4419-5370-1



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