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Electronics Reliability and Measurement Technology - Nondestructive Evaluation (Hardcover)
Joseph S. HeymanThis book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
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Product Description
This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
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Product Details
General
Imprint | William Andrew Publishing |
Country of origin | United States |
Release date | December 1998 |
Availability | Expected to ship within 10 - 15 working days |
First published | 1999 |
Authors | Joseph S. Heyman |
Dimensions | 229 x 152 x 9mm (L x W x T) |
Format | Hardcover |
Pages | 140 |
ISBN-13 | 978-0-8155-1171-7 |
Barcode | 9780815511717 |
Categories | |
LSN | 0-8155-1171-X |
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