Quadrupoles in Electron Lens Design, Volume 224 (Hardcover)


Coulomb Interactions in Particle Beams, Volume 223 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods used in all these domains, with this release exploring Coulomb Interactions in Particle Beams.

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Product Description

Coulomb Interactions in Particle Beams, Volume 223 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods used in all these domains, with this release exploring Coulomb Interactions in Particle Beams.

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Product Details

General

Imprint

Academic Press Inc

Country of origin

United Kingdom

Series

Advances in Imaging and Electron Physics

Release date

November 2022

Availability

Expected to ship within 12 - 17 working days

First published

2022

Editors

,

Dimensions

229 x 152mm (L x W)

Format

Hardcover

Pages

398

ISBN-13

978-0-323-98865-0

Barcode

9780323988650

Categories

LSN

0-323-98865-2



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