This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.
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This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.
Imprint | Springer |
Country of origin | Netherlands |
Release date | October 2010 |
Availability | Expected to ship within 10 - 15 working days |
First published | 2007 |
Editors | Raoul Velazco, Pascal Fouillat, Ricardo Reis |
Dimensions | 235 x 155 x 14mm (L x W x T) |
Format | Paperback |
Pages | 269 |
Edition | Softcover reprint of hardcover 1st ed. 2007 |
ISBN-13 | 978-90-481-7417-1 |
Barcode | 9789048174171 |
Categories | |
LSN | 90-481-7417-1 |