Structural Analysis of Point Defects in Solids - An Introduction to Multiple Magnetic Resonance Spectroscopy (Paperback, Softcover reprint of the original 1st ed. 1992)

, ,
Strutural Analysis of Point Defects in Solids introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy essentialfor applications to the determination of microscopic defect structures. Investigations of the microscopic and electronic structure, and also correlations with the magnetic propertiesof solids, require various multiple magnetic resonance methods, such as ENDOR and optically detected EPR or ENDOR. This book discusses experimental, technological and theoretical aspects of these techniques comprehensively, from a practical viewpoint, with many illustrative examples taken from semiconductors and other solids. The nonspecialist is informed about the potential of the different methods, while the researcher faced with the task of determining defect structures isprovided with the necessary tools, together with much information on computer-aided methods of data analysis and the principles of modern spectrometer design.

R1,584

Or split into 4x interest-free payments of 25% on orders over R50
Learn more

Discovery Miles15840
Mobicred@R148pm x 12* Mobicred Info
Free Delivery
Delivery AdviceShips in 10 - 15 working days


Toggle WishListAdd to wish list
Review this Item

Product Description

Strutural Analysis of Point Defects in Solids introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy essentialfor applications to the determination of microscopic defect structures. Investigations of the microscopic and electronic structure, and also correlations with the magnetic propertiesof solids, require various multiple magnetic resonance methods, such as ENDOR and optically detected EPR or ENDOR. This book discusses experimental, technological and theoretical aspects of these techniques comprehensively, from a practical viewpoint, with many illustrative examples taken from semiconductors and other solids. The nonspecialist is informed about the potential of the different methods, while the researcher faced with the task of determining defect structures isprovided with the necessary tools, together with much information on computer-aided methods of data analysis and the principles of modern spectrometer design.

Customer Reviews

No reviews or ratings yet - be the first to create one!

Product Details

General

Imprint

Springer-Verlag

Country of origin

Germany

Series

Springer Series in Solid-State Sciences, 43

Release date

2012

Availability

Expected to ship within 10 - 15 working days

First published

1992

Authors

, ,

Dimensions

235 x 155 x 20mm (L x W x T)

Format

Paperback

Pages

367

Edition

Softcover reprint of the original 1st ed. 1992

ISBN-13

978-3-642-84407-2

Barcode

9783642844072

Categories

LSN

3-642-84407-3



Trending On Loot