Electrothermal Analysis of VLSI Systems (Paperback, Softcover reprint of the original 1st ed. 2000)

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This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.

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Product Description

This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.

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Product Details

General

Imprint

Springer-Verlag New York

Country of origin

United States

Release date

April 2013

Availability

Expected to ship within 10 - 15 working days

First published

2002

Authors

, , ,

Dimensions

235 x 155 x 13mm (L x W x T)

Format

Paperback

Pages

210

Edition

Softcover reprint of the original 1st ed. 2000

ISBN-13

978-1-4757-7373-6

Barcode

9781475773736

Categories

LSN

1-4757-7373-0



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