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Sell On LootResonant X-Ray Scattering in Correlated Systems (Hardcover, 1st ed. 2017)
The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.
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Product Description
The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.
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Product Details
General
Imprint | Springer-Verlag |
Country of origin | Germany |
Series | Springer Tracts in Modern Physics, 269 |
Release date | 2017 |
Availability | Expected to ship within 10 - 15 working days |
First published | 2017 |
Editors | Youichi Murakami, Sumio Ishihara |
Dimensions | 235 x 155 x 16mm (L x W x T) |
Format | Hardcover |
Pages | 241 |
Edition | 1st ed. 2017 |
ISBN-13 | 978-3-662-53225-6 |
Barcode | 9783662532256 |
Categories | Books - All Books  Science & MathematicsPhysicsStates of matterCondensed matter physics (liquids & solids)Books - All Books Professional & TechnicalIndustrial chemistry & manufacturing technologiesOther manufacturing technologiesPrecision instruments manufactureGeneral |
LSN | 3-662-53225-5 |
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