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Status
Available to order
Brand
Morgan Kaufmann Publishers In
Springer
Springer-Verlag New York
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Showing 7 Results in All Departments
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VLSI Test Principles and Architectures - Design for Testability (Hardcover, New)
Laung-terng Wang
,
Cheng-Wen Wu
,
Xiaoqing Wen
R
1,920
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Ships in 12 - 17 working days
Electronic Design Automation - Synthesis, Verification, and Test (Hardcover)
List Price
R
2,369
R
2,284
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Delay Fault Testing for VLSI Circuits (Paperback, Softcover reprint of the original 1st ed. 1998)
Angela Krstic
,
Kwang-Ting (Tim) Cheng
R
4,458
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Ships in 10 - 15 working days
Formal Equivalence Checking and Design Debugging (Paperback, Softcover reprint of the original 1st ed. 1998)
Shi-Yu Huang
,
Kwang-Ting (Tim) Cheng
R
5,235
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Delay Fault Testing for VLSI Circuits (Hardcover, 1998 ed.)
Angela Krstic
,
Kwang-Ting (Tim) Cheng
R
4,611
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Ships in 10 - 15 working days
Formal Equivalence Checking and Design Debugging (Hardcover, 1998 ed.)
Shi-Yu Huang
,
Kwang-Ting (Tim) Cheng
R
5,401
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Ships in 10 - 15 working days
Unified Methods for VLSI Simulation and Test Generation (Hardcover, 1989 ed.)
Kwang-Ting (Tim) Cheng
,
Vishwani D. Agrawal
R
3,054
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Ships in 10 - 15 working days